System and method for shape measurements on thick MPR images
US8917941B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 26, 2011 |
| Grant date | Dec 23, 2014 |
| Priority date | — |
| Expiry date | Sep 26, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for measuring shapes in thick multi-planar reformatted (MPR) digital images, including identifying a shape in a digital MPR image, scan-converting points corresponding to the identified shape on a starting plane of an MPR slab in an image volume from which the MPR was obtained to generate a plurality of starting points for the identified shape, calculating an end point in the MPR slab corresponding to each starting point, propagating a ray from each starting point to each corresponding end point, accumulating samples along each ray, and computing a desired measurement value from the accumulated samples after reaching the end point for all rays.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.