Embedded force measurement
US8922523B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2011 |
| Grant date | Dec 30, 2014 |
| Priority date | — |
| Expiry date | Aug 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04105
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed embodiments relate to a force detection system that detects force exerted on a flexible display based upon changes in resistance and/or capacitance. In one embodiment, a method includes measuring a baseline comprising a baseline resistance or a baseline capacitance or both of a force measurement layer disposed within or overlaid on the display panel. The method further includes detecting a change in the baseline resistance or the baseline capacitance or both and calculating a change location where the change in the baseline resistance or the baseline capacitance or both occurred. The method also includes calculating a magnitude of the change in the baseline resistance or the baseline capacitance or both.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.