Projection aided feature measurement using uncalibrated camera
US8922647B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2011 |
| Grant date | Dec 30, 2014 |
| Priority date | — |
| Expiry date | Jun 12, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring a feature of an article may include projecting a scale template onto the article at a predetermined size. The method may additionally include projecting a measurement pattern onto the article. An image containing the feature, the scale template, and the measurement pattern may be recorded by the camera. The method may further include determining a scale factor of the image based on the scale template, and determining a size and/or a location of the feature based upon the measurement pattern and the image scale factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.