Patent · US Active

Projection aided feature measurement using uncalibrated camera

US8922647B2 · kind B2 · utility

12Cited by
10References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 3, 2011
Grant dateDec 30, 2014
Priority date
Expiry dateJun 12, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring a feature of an article may include projecting a scale template onto the article at a predetermined size. The method may additionally include projecting a measurement pattern onto the article. An image containing the feature, the scale template, and the measurement pattern may be recorded by the camera. The method may further include determining a scale factor of the image based on the scale template, and determining a size and/or a location of the feature based upon the measurement pattern and the image scale factor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.