Methods to perform backscatter inspection of complex targets in confined spaces

US8923481B2 · kind B2 · utility

Assignee

• American Science and Engineering, Inc. · US

Inventors

• Jeffrey R. Schubert · Somerville, US
• John P. Handy · Nashua, US
• Richard Schueller · Chelmsford, US
• Terry McElroy · Arlington, US
• David C. Walazek · Billerica, US
• William J. Baukus · Nashua, US

Key dates

• Filing date: Apr 13, 2012
• Grant date: Dec 30, 2014
• Expiry date: Feb 14, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N23/203
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.