Patent · US Active

Calibration measurements for network analyzers

US8928333B2 · kind B2 · utility

1Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 2011
Grant dateJan 6, 2015
Priority date
Expiry dateMar 27, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.