Sketched overdrawn lines for editing spline-based three-dimensional curves
US8928652B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 11, 2011 |
| Grant date | Jan 6, 2015 |
| Priority date | — |
| Expiry date | Mar 24, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2021
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An overdraw method for editing a three-dimensional geometry includes receiving a three-dimensional geometry including a plurality of individual curves whose positions are defined by a plurality of control points, receiving a polyline overdrawn on the three-dimensional geometry, matching the polyline to the three-dimensional geometry to determine a portion of the three-dimensional geometry being modified, recognizing a shape feature of the polyline to determine a shape modification to apply to the three-dimensional geometry, shifting the three-dimensional geometry to determine a modified geometry by changing a position of at least one of the control points towards the polyline, and matching the modified geometry with at least one symmetry operator to determine whether the changed position satisfies a constraint and applying the constraint to the modified geometry to further modify the modified geometry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.