Gas detection system using semiconductor laser with feedback compensation by gas reference cavity
US8928885B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2014 |
| Grant date | Jan 6, 2015 |
| Priority date | — |
| Expiry date | Oct 1, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/13
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gas detection system using a semiconductor laser with a reference gas cavity compensation is provided, said system comprising a first light source emitting a first beam of a first wavelength as a detection beam; a second light source emitting a second beam of a second wavelength, which is different from the first wavelength, as a reference beam; a first wavelength division multiplexer connected with said first light source and said second light source; a broadband coupler connected with said first wavelength division multiplexer; a reference gas chamber, which is introduced with reference gas of the same composition as that of the gas to be detected and of a known concentration; a detection gas chamber, which is introduced with the gas to be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.