Application-specific repeat defect detection in web manufacturing processes
US8935104B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 2011 |
| Grant date | Jan 13, 2015 |
| Priority date | — |
| Expiry date | May 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8918
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.