Test data generation
US8935575B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2012 |
| Grant date | Jan 13, 2015 |
| Priority date | — |
| Expiry date | Mar 1, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for test data generation are described. In one implementation, the method includes receiving seed data having one or more characteristics. Further, the method includes obtaining a selection criterion indicating a selected portion of the seed data to be transformed. Based on the selection criterion, the seed data is transformed for at least a plurality of iterations to generate test data. The test data comprise a plurality of data sets including a primary data set generated in a first iteration and a secondary data set generated in each subsequent iteration. The primary data set includes transformed data corresponding to the selected portion of the seed data and non-transformed data corresponding to a remaining portion of the seed data and each secondary data set includes transformed data corresponding to the selected portion of the seed data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.