Patent · US Active

Wafer level lens, production method of wafer level lens, and imaging unit

US8936371B2 · kind B2 · utility

4Cited by
0References
23Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 16, 2014
Grant dateJan 20, 2015
Priority date
Expiry dateMay 16, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B13/001
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A sufficient light-shielding property is obtained by a wafer level lens having at least one lens module having a substrate and a plurality of lenses formed on the substrate in which the wafer level lens has a black resist layer formed on the surface of the lens module or on the surface of the substrate and the black resist layer is formed with a pattern having an opening at a part intersecting the optical axis of the lens, and generation of defects such as ghosts, flares and the like due to a reflected light can be prevented and an increase in the production cost can be suppressed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.