Complex index refraction tomography with sub λ/6-resolution
US8937722B2 · kind B2 · utility
8Cited by
4References
15Claims
0Family size
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Key dates
| Filing date | Mar 28, 2011 |
| Grant date | Jan 20, 2015 |
| Priority date | — |
| Expiry date | Apr 15, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2001/005
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.