Vertical microcavity with curved surface defects
US8937763B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2013 |
| Grant date | Jan 20, 2015 |
| Priority date | — |
| Expiry date | Jun 1, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/18344
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A vertical microcavity having a layer structure perpendicular to a vertical axis z, includes a first reflector and a second reflector, each comprising one or more material layers; a confinement layer between the reflectors, wherein an electromagnetic wave can be substantially confined, the confinement layer having a body and a defect delimited by first and second surfaces, perpendicular to the vertical axis z; wherein one of the two surfaces is contiguous with the body, the other one contiguous with a layer of the first or second reflector, and wherein one of the two surfaces has a curved profile in at least a plane section perpendicular to the layer structure, the curved profile having a vertex, which defines a maximal thickness h0 of the defect between the first surface and the second surface in the plane section, the maximal thickness h0 being less than a thickness of the contiguous layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.