Mutations on input for test generation
US8938646B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 2012 |
| Grant date | Jan 20, 2015 |
| Priority date | — |
| Expiry date | May 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus and product to be used in verification. The method comprising: based on a test generation input that defines a plurality of requirements automatically determining a mutated test generation input, wherein the mutated test generation input defining a mutated requirement which is absent from the test generation input, wherein the mutated requirement is based on a requirement of the plurality of requirements and contradicts, at least in part, the plurality of requirements; and generating one or more test-cases based on the mutated test generation input, whereby the one or more test-cases violate at least one requirement of the test generation input.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.