Method for determining the concentration of an element in a material
US8942344B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Feb 9, 2012 |
| Grant date | Jan 27, 2015 |
| Priority date | — |
| Expiry date | Nov 19, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the concentration of an element in a material includes irradiating the material with an X-ray beam having a continuum in the area of an absorption edge of the element to be measured. The intensity of the transmitted X-ray beam is measured with an energy dispersive sensor. The intensity of the transmitted X-ray beam in an energy interval above the absorption edge and in an energy interval below the absorption edge is determined. The concentration of the element is computed on the basis of said intensities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.