Method for inspecting a manufacturing device

US8942837B2 · kind B2 · utility

Assignee

• UNITED TECHNOLOGIES CORPORATION · US

Inventors

• James Romanelli · Colchester, US
• Jeffrey S. Beattie · South Glastonbury, US
• Jesse R. Boyer · Middletown, US
• Robert E. Erickson · Midland, US
• Randall W. Joyner · Union, US
• Daniel A. Snyder · Manchester, US
• David A. Krause · Hersbruck, DE
• Kun Yuan Tong · Town of West Hartford, US

Key dates

• Filing date: Mar 12, 2012
• Grant date: Jan 27, 2015
• Expiry date: Jul 19, 2033

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02P90/02
• WIPO field: Control
• WIPO sector: Instruments

Abstract

A method is provided for inspecting a plurality of parts with an electronic measurement device and a processing system. The method includes a step of creating surface geometry maps of the parts utilizing the electronic measurement device, where each part was manufactured utilizing the manufacturing device. Geometric part models of the parts are generated from the surface geometry maps. The part models can subsequently be analyzed to determine whether a manufacturing device that manufactured the plurality of parts manufactures parts that comply with a part design specification.