Method for identifying materials using dielectric properties through active millimeter wave illumination
US8946641B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2012 |
| Grant date | Feb 3, 2015 |
| Priority date | — |
| Expiry date | Apr 20, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein is a method by which active millimeter wave radiation may be used to detect and identify the composition of concealed metallic, concealed non-metallic, concealed opaque or concealed semi-transparent materials based on their optical properties. By actively radiating a semi-transparent target anomaly with multiple millimeter wave radiation frequencies, the dielectric properties of the target anomaly can be identified. The dielectric properties of the target anomaly may then be compared to a library of dielectric properties attributed to semi-transparent materials of interest. This method will allow active millimeter wave radiation technology to identify the likely composition of targeted semi-transparent materials through absorption and illumination measurements attributed to the dielectric properties of the targeted composition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.