Method and system for measuring the resistance of a resistive structure
US8947101B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 4, 2013 |
| Grant date | Feb 3, 2015 |
| Priority date | — |
| Expiry date | Aug 5, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and system for measuring the resistance of a resistive structure having at least three nodes. A first calibration signal is determined by measuring a voltage at an output of the resistance structure when no calibration current is injected into a third node between the first and second nodes of the structure. A calibration current is then injected into the third node and a second calibration signal is determined. The absolute value of the difference between the first calibration signal and the second calibration signal is determined, the absolute value being proportional to a product of the resistance of the resistive structure and the calibration current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.