Patent · US Active

Techniques for workload toxic mapping

US8949832B2 · kind B2 · utility

0Cited by

7References

20Claims

0Family size

Assignee

Novell, Inc. · US

Inventors

Jeremy Ray Brown · Bluffdale, US
Jason Allen Sabin · Lehi, US
Nathaniel Brent Kranendonk · Springville, US
Kal A. Larsen · Provo, US
Lloyd Leon Burch · Payson, US
Matthew Holt · Las Vegas, US
Michael John Jorgensen · Mapleton, US
Michael Fairbanks · Lindon, US
Chad Buttars · Pleasant Grove, US

Key dates

Filing date	Aug 29, 2011
Grant date	Feb 3, 2015
Priority date	—
Expiry date	Jul 22, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3055
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Techniques for toxic workload mapping are provided. A state of a target workload is recorded along with a configuration and state of an environment that is processing the workload. Micro valuations are taken, via statistical sampling, for metrics associated with the workload and for different combinations of resources within the environment. The sampling taken at micro second intervals. The valuations are aggregated to form an index representing a toxic mapping for the workload within the environment. The toxic mapping is mined, in view of policy, to provide conditions and scenarios that may be deemed problematic within the workload and/or environment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.