Creating environmental snapshots of storage device failure events
US8949863B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2008 |
| Grant date | Feb 3, 2015 |
| Priority date | — |
| Expiry date | Jun 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/86
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A storage device failure in a computer storage system can be analyzed by the storage system by examining relevant information about the storage device and its environment. Information about the storage device is collected in real-time and stored; this is an on-going process such that some information is continuously available. The information can include information relating to the storage device, such as input/output related information, and information relating to a storage shelf where the storage device is located, such as a status of adjacent storage devices on the shelf. All of the relevant information is analyzed to determine a reason for the storage device failure. Optionally, additional information may be collected and analyzed by the storage system to help determine the reason for the storage device failure. The analysis and supporting information can be stored in a log and/or presented to a storage system administrator to view.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.