Patent · US Active

System test scope and plan optimization

US8954931B2 · kind B2 · utility

10Cited by

4References

18Claims

0Family size

Assignee

SAP SE · DE

Inventors

Marcus Wefers · Heidelberg, DE
Reinhold Konnerth · Dielheim, DE
Thierry Lieu · Grasse, FR
Abdelhak Nezzari · Cannes, FR
Michael Schaffrath · Leipzig, DE
Torsten Kamenz · Wiesloch, DE
Andreas Kemmler · Brackenheim, DE

Key dates

Filing date	Aug 3, 2012
Grant date	Feb 10, 2015
Priority date	—
Expiry date	Nov 24, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3684
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Various embodiments include at least one or systems, methods, and software providing abilities to automatically generate a test plan that mitigates risk involved in testing less than an entirety of a software system following modification. Some embodiments operate to allow a user to influence the scope of an optimized test plan while also reducing a number of tests and test execution effort involved. Such embodiments may identify portions of the software system to test and portions of the software system that will not be tested in a manner that reduces a total testing effort involved. Reductions in testing effort are performed in generation of the test plan in view of testing preferences which are utilized not only to reduce the total effort in executing a test plan, but also does so to optimize the test plan.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.