Methods and apparatus to mitigate instrument landing system overflight interference
US8958932B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2013 |
| Grant date | Feb 17, 2015 |
| Priority date | — |
| Expiry date | Jul 14, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods to mitigate instrument landing system (ILS) overflight interference are disclosed. An example method performing a first measurement of a position of an aircraft relative to a first location based on an instrument landing system, performing a second measurement of the position of the aircraft based on inertial measurements performed over a first time period occurring prior to the first measurement, performing a third measurement of the position of the aircraft based on inertial measurements performed over a second time period greater than the first time period and occurring prior to the first measurement, and generating guidance information based on a selected one of the first, second, or third measurements of the position of the aircraft.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.