Patent · US Active

Electronic device, system, and method for testing exception handling mechanism

US8959394B2 · kind B2 · utility

1Cited by
10References
14Claims
0Family size

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Key dates

Filing dateNov 12, 2012
Grant dateFeb 17, 2015
Priority date
Expiry dateAug 8, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for testing exception handling mechanism of an electronic device, the method includes: establishing a connection between the electronic device and another electronic device when the electronic device is booting up. Obtaining parameters of a timer of the electronic device in response to an operation of a user, and determining whether the parameters are satisfied by the another electronic device. Simulating an abnormal event to cause the electronic device not to start up successfully if the parameters are satisfied by the another electronic device. Determining that the exception handling mechanism of the electronic device works well when the parameters do satisfy the requirement and when the other electronic device is in fact restarted or turned off after an abnormal event has been simulated via the other electronic device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.