Patent · US Active

Atomic force microscope probe, method for preparing same, and uses thereof

US8959661B2 · kind B2 · utility

1Cited by

4References

22Claims

0Family size

Assignee

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES · FR

Inventors

Jérôme Polesel-Maris · Mexy, FR
Thomas Berthelot · Les Ulis, FR
Pascal Viel · Meudon, FR

Key dates

Filing date	Dec 20, 2011
Grant date	Feb 17, 2015
Priority date	—
Expiry date	Dec 20, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01Q60/42
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.