Universal test system for testing electrical and optical hosts
US8963573B2 · kind B2 · utility
12Cited by
20References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2011 |
| Grant date | Feb 24, 2015 |
| Priority date | — |
| Expiry date | Mar 13, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3185
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.