Frequency selective measuring device and frequency selective measuring method
US8964823B2 · kind B2 · utility
0Cited by
5References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 28, 2010 |
| Grant date | Feb 24, 2015 |
| Priority date | — |
| Expiry date | May 31, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring device is provided that includes a first transformation device, a first time-quantization device and a selection device. The first transformation device implements a transformation of at least one signal into the frequency domain. The first time-quantization device subdivides at least one signal into several signals disposed in time succession. The selection device implements a selection of partial signals suitable for a measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.