Obtaining debug information from a flash memory device
US8966319B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2011 |
| Grant date | Feb 24, 2015 |
| Priority date | — |
| Expiry date | Jan 20, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/362
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.