Method and device for measuring the thickness of any deposit of material on an inner wall of a structure
US8966979B2 · kind B2 · utility
8Cited by
5References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2010 |
| Grant date | Mar 3, 2015 |
| Priority date | — |
| Expiry date | Jul 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01H13/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the thickness of any deposit of material (28) on an inner wall (12) of a structure (14). The method comprises: (a) causing vibrations in the structure; (b) detecting said vibrations in the structure; (c) determining a resonance frequency of the structure based on the detected vibrations; and (d) determining the thickness of any deposit of material on the inner wall of the structure based on the determined resonance frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.