Patent · US Active

Method and device for measuring the thickness of any deposit of material on an inner wall of a structure

US8966979B2 · kind B2 · utility

8Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 2010
Grant dateMar 3, 2015
Priority date
Expiry dateJul 28, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01H13/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring the thickness of any deposit of material (28) on an inner wall (12) of a structure (14). The method comprises: (a) causing vibrations in the structure; (b) detecting said vibrations in the structure; (c) determining a resonance frequency of the structure based on the detected vibrations; and (d) determining the thickness of any deposit of material on the inner wall of the structure based on the determined resonance frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.