High speed, small footprint x-ray tomography inspection systems, devices, and methods
US8971484B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2012 |
| Grant date | Mar 3, 2015 |
| Priority date | — |
| Expiry date | Sep 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/226
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present subject matter relates to inspection systems, devices and methods for x-ray inspection of objects. A conveyor can move an object to be inspected through an inspection zone along a direction of travel, one or more multibeam x-ray source arrays can provide multiple collimated x-ray beams through the inspection zone along a direction substantially perpendicular to the direction of travel, and one or more x-ray detector arrays can detect x-ray beams passing through the inspection zone from the x-ray source array. X-ray signals detected by the x-ray detector array can be recorded to form multiple x-ray projection images of the object, and the multiple x-ray projection images can be processed into three-dimensional tomographic images of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.