Method for calibrating a linearizer and linearized electronic component
US8976895B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2013 |
| Grant date | Mar 10, 2015 |
| Priority date | — |
| Expiry date | May 29, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B2001/0425
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Method for calibrating a linearizer and linearized electronic component the method comprises predistortion, in a predistortion linearizer, of a signal upstream of an electronic component to compensate nonlinear distortion. Determining predistortion setting parameters comprises applying a bifrequency test signal to the component and measuring the relative amplitudes of the lines at the output of the component. A variable indicative of the magnitude |Kp| of the AM/PM conversion coefficient of the component is calculated on the basis of these measurements. The predistortion setting parameters are adjusted so as to minimize |Kp|. The method may in particular be implemented in a linearized amplifier device and in an amplifier test bench.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.