Patent · US Active

Membrane projection lithography

US8981337B1 · kind B1 · utility

10Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 2013
Grant dateMar 17, 2015
Priority date
Expiry dateSep 3, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D88/01
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The various technologies presented herein relate to a three dimensional manufacturing technique for application with semiconductor technologies. A membrane layer can be formed over a cavity. An opening can be formed in the membrane such that the membrane can act as a mask layer to the underlying wall surfaces and bottom surface of the cavity. A beam to facilitate an operation comprising any of implantation, etching or deposition can be directed through the opening onto the underlying surface, with the opening acting as a mask to control the area of the underlying surfaces on which any of implantation occurs, material is removed, and/or material is deposited. The membrane can be removed, a new membrane placed over the cavity and a new opening formed to facilitate another implantation, etching, or deposition operation. By changing the direction of the beam different wall/bottom surfaces can be utilized to form a plurality of structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.