Method for auto-depicting trends in object contours
US8983205B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 23, 2013 |
| Grant date | Mar 17, 2015 |
| Priority date | — |
| Expiry date | Aug 23, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/13
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein is a method for auto-depicting trends in object contours (referred to as ADTOC). At the heart of ADTOC is a sifting process to determine a significant angular value via evaluating a plurality of angular values in a predefined range. ADTOC is characterized in that a probe-ahead concept is applied to obtain a reference angular value along the current route, and then the probed angular value is used to modify the significant angular value in order to timely correct the subsequent trace direction, thus achieving more accurate trace result. Contours with discontinuous segments caused by noise, obstacles, illumination, shading variations, etc. can also be auto-depicted without requiring a predefined auxiliary route.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.