Patent · US Active

System and method of measuring a sensor offset

US8983788B2 · kind B2 · utility

0Cited by

2References

16Claims

0Family size

Assignee

GM GLOBAL TECHNOLOGY OPERATIONS LLC · US

Inventors

Wei D. Wang · Troy, US
Steven E. Schulz · Torrance, US
Jeffrey David · Milford, US
Jackie L. Cui · Torrance, US
Andrew M. Zettel · Ann Arbor, US
Hanne Buur · Brighton, US

Key dates

Filing date	Oct 1, 2010
Grant date	Mar 17, 2015
Priority date	—
Expiry date	Mar 30, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01D18/006
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method includes detecting a first event and executing a first procedure to identify a sensor offset in response to detecting the first event. The method further includes determining, via a computing device, whether the sensor offset was measured during the execution of the first procedure, scheduling a second procedure to execute in response to detecting a second event if the sensor offset was not measured during the first procedure, and scheduling the first procedure to execute in response to detecting a subsequent occurrence of the first event if the sensor offset was measured during the first procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.