Beam scattering laser monitor
US8988673B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2011 |
| Grant date | Mar 24, 2015 |
| Priority date | — |
| Expiry date | Nov 29, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/0422
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
New systems for characterizing laser beams, using measurements performed on light which has been Rayleigh scattered from the beam. Different implementations are used for beam profiling, using images of the Rayleigh scattered light, and for laser beam power measurement, using the integrated Rayleigh scattered light. Both of these implementations can be applied to laser beams having high powers, since the measurements do not require insertion of any element into the beam itself, but rather depend on light scattered laterally from the passing beam. The measurements can thus be termed “non contact” measurements, in contrast to prior art methods which require an element inserted into the beam. The systems use Rayleigh scattering from the laser beam passing through ambient air, such that no special scattering chambers or liquids are required for the measurements. Special cancellation algorithms or filters are used to discriminate from light arising from scattering from dust particles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.