Spectroscopic measurement device and spectroscopic measurement method
US8988689B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 6, 2011 |
| Grant date | Mar 24, 2015 |
| Priority date | — |
| Expiry date | Oct 12, 2031 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2562/0233
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Multiple rays such as scattered lights and fluorescent lights emitted radially in a variety of directions from each bright point in a measurement area enter an objective lens, where the multiple rays are converted into a parallel beam. The parallel beam is reflected by both a reference mirror unit and an oblique mirror unit, and the reflected beams pass through an imaging lens to form an interference image on a light-receiving surface of a detection unit. The detection of the light intensity of the interference image on the light-receiving surface enables an acquisition of the interferogram (the waveform of the change of imaging intensity) in which the light intensity continuously changes. By Fourier-converting the interferogram, spectral characteristics can be obtained which show the relative intensities for each wavelength of the lights emitted from one bright point of an object to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.