Method and device for measuring permittivity and/or permeability
US8994386B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2010 |
| Grant date | Mar 31, 2015 |
| Priority date | — |
| Expiry date | May 18, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N22/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for measuring the permittivity and/or perviousness of a sample of a nonconductive material, said method comprising: a) measuring a value representative of an admittance Ytestco, b) measuring a value representative of an admittance Ytestcc only from the amplitude and the phase of the electromagnetic waves reflected onto an interface between the sample and the end of a second waveguide having at least one conductive web separated from a conductive sheath by a layer of dielectric material, said second waveguide also including a short circuit between the central web and the sheath at the interface with the sample, and c) calculating the permittivity of the sample from the values representative of the admittances Ytestco and Ytestcc and/or calculating the perviousness of the sample from the values representative of the admittances Ytestco and Ytestcc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.