Specimen information acquisition system
US8995615B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2013 |
| Grant date | Mar 31, 2015 |
| Priority date | — |
| Expiry date | Oct 23, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specimen information acquisition system is provided with a first grating which divides divergent X-rays from an X-ray source to form a plurality of primary X-ray beams, and a second grating which blocks at least a part of each of the primary X-ray beams to form a plurality of secondary X-ray beams. The specimen information acquisition system is further provided with an X-ray detector which detects the secondary X-ray beams and a calculator which calculates information of a specimen arranged between the X-ray source and the X-ray detector. The primary X-ray beams do not overlap each other on each of X-ray transmitting portions of the second grating. The edges of the respective primary X-ray beams enter a plurality of X-ray blocking portions of the second grating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.