Methods, systems and apparatus for defect detection and classification
US8995747B2 · kind B2 · utility
4Cited by
18References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2010 |
| Grant date | Mar 31, 2015 |
| Priority date | — |
| Expiry date | Oct 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.