Embedded strip lot autocalibration
US8999125B2 · kind B2 · utility
2Cited by
85References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 6, 2008 |
| Grant date | Apr 7, 2015 |
| Priority date | — |
| Expiry date | Oct 20, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49155
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An auto-calibration system for diagnostic test strips is described for presenting data individually carried on each test strip readable by a diagnostic meter. The test strip meter may provide a predetermined varying resistance on one strip or a plurality of varying resistances from strip lot to strip lot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.