Patent · US Active

Contrast pattern application for three-dimensional imaging

US8999371B2 · kind B2 · utility

4Cited by
10References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 2012
Grant dateApr 7, 2015
Priority date
Expiry dateJul 22, 2032

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC09K3/30
  • WIPO fieldPharmaceuticals
  • WIPO sectorChemistry

Abstract

Provided herein are compositions for applying a reference marker pattern or grid to the surface of an object to be imaged three-dimensionally. These compositions can be quick drying for ease of use. Methods of use of the compositions are also provided as well as devices and kits for the application of the compositions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.