Microscope and observation method
US9001321B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2011 |
| Grant date | Apr 7, 2015 |
| Priority date | — |
| Expiry date | Nov 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2207/114
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a microscope and an observation method which can improve spatial resolution. A microscope according to an aspect of the invention includes a laser light source (10), an objective lens (16) that focuses light from the laser light source on a sample, and a detector (22) that detects the laser light as signal light from a sample (17) when the sample (17) is irradiated with the laser light. The light is applied to the sample with an intensity changed to obtain a nonlinear region where intensities of the light and the signal light have a nonlinear relation due to occurrence of saturation or nonlinear increase of the signal light when the light has a maximum intensity, and the detector (22) detects the signal light according to the intensity of the laser light to perform observation based on a saturation component or a nonlinear increase component of the signal light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.