Baseline capacitance calibration
US9007334B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 7, 2012 |
| Grant date | Apr 14, 2015 |
| Priority date | — |
| Expiry date | Dec 26, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0418
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An embodiment of the invention provides a method of creating a statistical model of a baseline capacitance CP of a capacitive sensor located on a capacitive-touch screen. A sensed capacitance CS of a capacitive sensor is measured during a particular state of the electronic device that includes the capacitive-touch screen. When physical contact is not made with the capacitive sensor, the sensed capacitance CS is stored as a baseline capacitance CP. The baseline capacitance CP is then used to create the statistical model for that particular state of the electronic device. When physical contact is made with the capacitive sensor, the value of the baseline capacitance CP of the capacitive sensor is subtracted from the value of the sensed capacitance CS and the result, CF=(CS−CP), is sent to a touch detection circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.