Patent · US Active

Automatic test method for an inspection device

US9008985B2 · kind B2 · utility

0Cited by
11References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 2, 2010
Grant dateApr 14, 2015
Priority date
Expiry dateMay 27, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG16Z99/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a test method for examining an inspection device, which is associated with a functional unit of a master unit, comprising at least the following steps: producing a specified number of faulty and/or correct containers or test containers by means of the functional unit itself in that a control signal for producing a distinctive element is fed to the functional unit; leading the faulty containers or test containers past the inspection device, which detects the faulty containers or test containers and produces a signal to discharge the faulty containers or test containers, or indicates a value regarding the expected and the measured faulty and/or correct containers. The test method is automatically started or performed and is suitable, for example, for examining a label position checking device, the filling amount checking unit, and the closure seating checking unit in order to be able to determine the fault-free functioning thereof or optionally the faulty functioning thereof. The test method is characterized in that operation is not required. The test method is characterized in that the test method allows clear and documented rules for the procedure and the t…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.