Application testing and analysis
US9009677B2 · kind B2 · utility
14Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2013 |
| Grant date | Apr 14, 2015 |
| Priority date | — |
| Expiry date | Apr 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Application testing and analysis may include performing perturbations to affect an environment associated with the application executing on a user device without affecting other applications executing on the user device. The execution of the application may be traced while the perturbations are being performed to determine an amount of resources of the user device consumed by the application and to determine whether a performance of the application was degraded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.