Selecting instrumentation points for an application
US9009680B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2006 |
| Grant date | Apr 14, 2015 |
| Priority date | — |
| Expiry date | Mar 14, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3612
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Instrumentation points are selected for an application by running the application with comprehensive instrumentation of its components in a development mode. The application can be run by a human operator and/or load simulator which provides requests to the application. The instrumented components are monitored as the application runs. A subset of the components is selected based on criteria such as an order in which the instrumented components are invoked, whether resource utilization, such as consumption of processor cycles, exceeds a threshold, or a frequency with which components are called or call other components, and only that subset is instrumented in a production mode of the application. In one approach, the subset includes components which are invoked when traffic to/from the application matches a pattern provided by an interaction model. As a result, relevant instrumentation points can be identified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.