Patent · US Active

Method and system for testing jitter compatibility

US9014552B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 28, 2010
Grant dateApr 21, 2015
Priority date
Expiry dateApr 13, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/0795
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A method and system for testing jitter compatibility are disclosed in the present invention, which includes: an interconnection testing board configured with a non-NRZ optical transponder needing to satisfy the board jitter performance specification, and according to the specification, testing the jitter performance of the interconnection testing board to indirectly judge whether the jitter compatibility of non-NRZ optical transponder at a line side of the interconnection testing board is qualified, wherein: at the line side and a client side of the interconnection testing board, a non-NRZ optical transponder to be tested and an NRZ optical transponder with qualified jitter performance are configured respectively, and the jitter performance of interconnection testing board is tested; if the qualified jitter performance of interconnection testing board is obtained through testing, believing that the jitter compatibility of non-NRZ optical transponder to be tested is qualified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.