Patent · US Active

Phase control for dual atom interferometers

US9019506B1 · kind B1 · utility

10Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2012
Grant dateApr 28, 2015
Priority date
Expiry dateJun 26, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/64
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first group of atoms and a second group of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first group and atoms in the second group. The first group of atoms and the second group of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first group of atoms or the second group of atoms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.