Method and device for high resolution full field interference microscopy
US9025150B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2011 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Jan 29, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.