Patent · US Active

Spectral phase analysis for precision ranging

US9025160B2 · kind B2 · utility

21Cited by

2References

22Claims

0Family size

Assignee

The Regents of the University of Colorado, a Body Corporate · US

Inventors

Eric Moore · Longmont, US
Robert R. McLeod · Boulder, US

Key dates

Filing date	Jan 30, 2012
Grant date	May 5, 2015
Priority date	—
Expiry date	Sep 2, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01S17/34
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Interferometric path length measurements using frequency-domain interferometry form the basis of several measurement techniques, including optical frequency domain reflectometry (OFDR), optical coherence tomography (OCT), and frequency-modulated continuous wave (FMCW) radar and lidar. A phase-sensitive and self-referenced approach to frequency-domain interferometry yields absolute and relative path length measurements with axial precision orders of magnitude better than the transform-limited axial resolution of the system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.