Method of optimizing solid state drive soft retry voltages
US9025393B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2013 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Oct 4, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of optimizing solid state drive (SSD) soft retry voltages comprises limiting a number of voltage reads and properly spacing and determining the reference voltage at which each voltage is read based on desired Bit Error Rate (BER) and channel throughput. The method determines each reference voltage for a number of soft retry voltage reads based on a hard decision read. The spacing between each read reference voltage is constant since each SSD type requires a number of reads for an accurate presentation of soft retry voltages. The voltage distance between each successive read is limited to a multiple of the constant spacing while the multiple is based on success or failure of the first read. The method determines a limited number of reads, the constant spacing between reads, and a desired reference voltage for each read, thereby increasing valuable throughput of the channel and decreasing BER.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.