System and method for multi-material correction of image data
US9025815B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2014 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Jul 15, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/408
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.